专利名称: | Method for Inspecting Ceramic Structures |
公开(告)号: | |
公开(公告)日: | 2008-08-28 00:00:00 |
申请(专利)号: | US2008205596 |
申请日: | 2005-03-31 00:00:00 |
发明(设计)人: | |
(申请)专利权(人): | KATO SHIGEKI (JP) |
内容: | There is provided a nondestructive method for inspecting ceramic structures, the method which not only easily detects the position and size of an internal defect in a ceramic structure in a short time, but also accurately identifies the position, shape, and size of the internal defect. In the method, the distribution of X-ray absorption coefficients (CT numbers) at fault planes of the ceramic structure is measured by irradiating the periphery of the ceramic structure with X rays along the periphery of the ceramic structure so that the X rays scan the entire periphery. The X rays are emitted from an X-ray tube at a tube voltage in the range of 80 to 400 kV and a tube current in the range of 2 to 400 mA. |
发布日期:2008-11-27 14:24:00