| 专利名称： | MULTILAYER CERAMIC ELECTRONIC DEVICE |
| 公开（告）号： | |
| 公开（公告）日： | 2008-09-04 00:00:00 |
| 申请（专利）号： | US2008212257 |
| 申请日： | 2007-10-31 00:00:00 |
| 发明（设计）人： | MURATA MANUFACTURING CO (JP) |
| (申请)专利权（人）： | SAKAMOTO NORIHIKO (JP);ABE TOMORO (JP) |
| 内容： | A highly reliable multilayer ceramic electronic device is obtained while preventing crack defects generated in a ceramic laminate by application of a heat shock in a mounting step or the like. The multilayer ceramic electronic device is constructed such that the average value of continuities of internal electrodes located in two regions (f) is lower by 5% to 20% inclusive than the average value of continuities of internal electrodes located in the central portion in a lamination direction. The two regions (f) are the regions from the topmost internal electrode and the bottommost internal electrode located in the lamination direction to the inside, respectively, within 10% of the distance (d) therebetween. Continuity is defined by (X-Y)/X in which X is the length of a cross section of an internal electrode in one direction and Y indicates the sum of gaps (g) formed by pores in the cross section of the internal electrode. |
发布日期：2008-12-03 10:57:00