专利名称: DEPOSITION OF PEROVSKITE AND OTHER COMPOUND CERAMIC FILMS FOR DIELECTRIC APPLICATIONS
公开(告)号:
公开(公告)日: 2007-03-08 00:00:00
申请(专利)号: WO2006US33315(WO2007027535)
申请日: 2006-08-24 00:00:00
发明(设计)人: SYMMORPHIX INC (US)ZHANG HONGMEI (US)
(申请)专利权(人): ZHANG HONGMEI (US);DEMARAY RICHARD E (US)
内容: In accordance with the present invention, deposition of perovskite material, for example barium strontium titanite (BST) film, by a pulsed-dc physical vapor deposition process or by an RF sputtering process is presented. Such a deposition can provide a high deposition rate deposition of a layer of perovskite. Some embodiments of the deposition address the need for high rate deposition of perovskite films, which can be utilized as a dielectric layer in capacitors, other energy storing devices and micro-electronic applications. Embodiments of the process according to the present invention can eliminate the high temperature (>700 DEG C.) anneal step that is conventionally needed to crystallize the BST layer. 

发布日期:2007-08-24 16:36:00

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