| 专利名称： | METHOD FOR INSPECTING CERAMIC STRUCTURES |
| 公开（告）号： | |
| 公开（公告）日： | 2006-12-13 00:00:00 |
| 申请（专利）号： | EP20050728592(EP1730503) |
| 申请日： | 2005-03-31 00:00:00 |
| 发明（设计）人： | NGK INSULATORS LTD (JP) |
| (申请)专利权（人）： | KATO SHIGEKI (JP) |
| 内容： | There is provided a nondestructive method for inspecting ceramic structures, the method which not only easily detects the position and size of an internal defect in a ceramic structure in a short time, but also accurately identifies the position, shape, and size of the internal defect. In the method, the distribution of X-ray absorption coefficients (CT numbers) at fault planes of the ceramic structure is measured by irradiating the periphery of the ceramic structure with X rays along the periphery of the ceramic structure so that the X rays scan the entire periphery. The X rays are emitted from an X-ray tube at a tube voltage in the range of 80 to 400 kV and a tube current in the range of 2 to 400 mA. |
发布日期：2007-08-17 08:48:00